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To cite this repository or the article in publications, please use:
Lei, C.L., Clerx, M., Whittaker, D.G., Gavaghan D.J., de Boer, T.P. and Mirams, G.R.
(2020).
Accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments.
Philosophical Transactions of the Royal Society A, 378: 20190348.
https://doi.org/10.1098/rsta.2019.0348
Lei, C.L., Clark, A.P., Clerx, M., Wei, S., Bloothooft, M., de Boer, T.P., Christini, D.J., Krogh-Madsen, T., and Mirams, G.R.
(2025).
Resolving Artifacts in Voltage-Clamp Experiments with Computational Modeling: An Application to Fast Sodium Current Recordings.
Advanced Science, 12, 30: e00691.
https://doi.org/10.1002/advs.202500691
BibTeX entries for LaTeX users are
@article{Lei2020Variability,
author = {Lei, Chon Lok and Clerx, Michael and Whittaker, Dominic G. and Gavaghan, David J. and de Boer, Teun P. and Mirams, Gary R. },
title = {Accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments},
journal = {Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences},
volume = {378},
number = {2173},
pages = {20190348},
year = {2020},
doi = {10.1098/rsta.2019.0348},
URL = {https://royalsocietypublishing.org/doi/abs/10.1098/rsta.2019.0348},
eprint = {https://royalsocietypublishing.org/doi/pdf/10.1098/rsta.2019.0348}
}
@article{Lei2025Artifacts,
author = {Lei, Chon Lok and Clark, Alexander P. and Clerx, Michael and Wei, Siyu and Bloothooft, Meye and de Boer, Teun P. and Christini, David J. and Krogh-Madsen, Trine and Mirams, Gary R.},
title = {Resolving Artifacts in Voltage-Clamp Experiments with Computational Modeling: An Application to Fast Sodium Current Recordings},
journal = {Advanced Science},
volume = {12},
number = {30},
pages = {e00691},
year = {2025},
doi = {https://doi.org/10.1002/advs.202500691},
URL = {https://advanced.onlinelibrary.wiley.com/doi/abs/10.1002/advs.202500691},
eprint = {https://advanced.onlinelibrary.wiley.com/doi/pdf/10.1002/advs.202500691}
}